• DocumentCode
    2451306
  • Title

    Multivariate image analysis for defect identification of apple fruit images

  • Author

    VijayaRekha, K.

  • Author_Institution
    Technol. & Res. Acad., SASTRA Univ., Thanjavur
  • fYear
    2008
  • fDate
    10-13 Nov. 2008
  • Firstpage
    1499
  • Lastpage
    1503
  • Abstract
    External defect identification of apples involving humans suffer from disadvantages which can be greatly reduced using machine vision applications. The bruises appearing on the surface which may result due to post harvest handling may not show up in images taken in the visual range. Multispectral imaging technique works with images of object obtained in several bands in the visual and infrared regions of the electromagnetic spectrum. The images taken in narrow bands are highly correlated. For decomposing these correlated data principal component analysis is used. The score space and the image space can be used for feature extraction and further image segmentation. This paper discusses the multivariate image analysis technique applied to the defect segmentation of apple fruit and explains the procedure adopted with the results obtained.
  • Keywords
    computer vision; feature extraction; food products; image classification; image segmentation; infrared imaging; principal component analysis; apple fruit image defect identification; defect classification; electromagnetic spectrum infrared region; feature extraction; image segmentation; machine vision application; multispectral imaging technique; multivariate image analysis; principal component analysis; Electromagnetic spectrum; Humans; Image analysis; Image segmentation; Infrared imaging; Infrared spectra; Machine vision; Multispectral imaging; Narrowband; Principal component analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-1767-4
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2008.4758175
  • Filename
    4758175