DocumentCode :
2451715
Title :
A physics-based empirical pseudopotential model for calculating band structures of simple and complex semiconductors
Author :
Pennington, Gary ; Goldsman, Neil ; McGarrity, James M. ; Crowne, Frank
Author_Institution :
Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
fYear :
2000
fDate :
2000
Firstpage :
229
Lastpage :
232
Abstract :
The full zone band structure is often needed for adequate simulation of semiconductor devices. It is important for devices operating under high power and high fields and determines many material properties. The computational ease and good accuracy of the empirical pseudopotential method (EPM) make it the band structure method of choice for full-zone simulations. While the EPM works well for most diamond and zincblende semiconductors, it becomes less effective for more complicated structures with larger unit cells. For these materials, more EPM parameters must be fitted while less experimental data is usually available. Through the adaption of the nonlocal atomic model potential of Heine and Animalu (Phil. Mag. vol. 12, pp. 1249-1269, 1965), we have developed a model empirical pseudopotential which, by drastically reducing the fitting parameters needed, can extend the use of the EPM to semiconductors with large unit cells. The method is effectively applied to the band structure calculations of Si, C, 3C-SiC, 4H-SiC, and 6H-SiC here
Keywords :
band theory; curve fitting; diamond; elemental semiconductors; pseudopotential methods; semiconductor device models; silicon; silicon compounds; wide band gap semiconductors; 3C-SiC band structure; 4H-SiC band structure; 6H-SiC band structure; C; C band structure; EPM parameter fitting; Si; Si band structure; SiC; band structure calculation; band structure method; complex semiconductor structures; computational accuracy; computational ease; diamond semiconductors; empirical pseudopotential method; empirical pseudopotential model; fitting parameters; full zone band structure; full-zone simulations; material properties; nonlocal atomic model potential; physics-based empirical pseudopotential model; semiconductor device simulation; semiconductors; unit cell size; zincblende semiconductors; Animal structures; Atomic measurements; Charge transfer; Computational modeling; Damping; Dielectrics; Educational institutions; Electrons; Laboratories; Predictive models;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation of Semiconductor Processes and Devices, 2000. SISPAD 2000. 2000 International Conference on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-6279-9
Type :
conf
DOI :
10.1109/SISPAD.2000.871250
Filename :
871250
Link To Document :
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