• DocumentCode
    2451936
  • Title

    Choosing an optimum large signal model for GaAs MESFETs and HEMTs

  • Author

    Miller, M. ; Golio, M. ; Beckwith, B. ; Arnold, E. ; Halchin, D. ; Ageno, S. ; Dorn, S.

  • Author_Institution
    Motorola Strategic Electron. Div., Chandler, AZ, USA
  • fYear
    1990
  • fDate
    8-10 May 1990
  • Firstpage
    1279
  • Abstract
    Seven large signal MESFET models and three newly developed HEMT (high-electron-mobility transistor) models have been compared, providing the microwave circuit designer with a practical benchmark. The error for each model is quantified and minimized using a modified Newton´s method with the restricted step technique of K. Levenberg (1944) and D. Marquardt (1963). This minimum obtainable error is used as a basis for comparing the models. The validity of this approach is confirmed by comparing predicted to measured large-signal performance made on a Triquint 0.5- mu m-gate-length MESFET. The model comparison tool has also been utilized to develop a general approach to large signal HEMT modeling for circuit simulation applications. A 0.7- mu m-gate-length pseudomorphic HEMT device was used for this portion of the study.<>
  • Keywords
    III-V semiconductors; Schottky gate field effect transistors; circuit CAD; gallium arsenide; high electron mobility transistors; nonlinear network analysis; semiconductor device models; solid-state microwave devices; 0.5 micron; 0.7 micron; 0.7- mu m-gate-length pseudomorphic HEMT device; GaAs transistors; Triquint 0.5- mu m-gate-length MESFET; circuit simulation applications; high-electron-mobility transistor; large signal HEMT modeling; large signal MESFET models; measured large-signal performance; model comparison tool; model selection; modified Newton´s method; optimum large signal model; semiconductors; Capacitance; Circuit simulation; Equations; Gallium arsenide; HEMTs; MESFETs; MODFETs; Parameter extraction; Predictive models; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1990., IEEE MTT-S International
  • Conference_Location
    Dallas, TX
  • Type

    conf

  • DOI
    10.1109/MWSYM.1990.99812
  • Filename
    99812