Title :
Using DC nanovoltmeters for low-frequency spectral analysis of voltage reference standards
Author_Institution :
Bur. Int. des Poids et Mesures, Sevres, France
Abstract :
It is shown that low-frequency spectral analysis can now be carried out easily and cheaply with personal computers. This method was used to determine the bandwidths of DC nanovoltmeters and to provide clearer interpretations of the filter and statistical functions in these instruments. Once characterized, the nanovoltmeters were used to study the noise characteristics of standard cells and Zener-diode reference standards.
Keywords :
digital voltmeters; electric noise measurement; measurement standards; microcomputer applications; spectral analysis; voltage measurement; voltmeters; 5 mHz to 10 Hz; DC nanovoltmeters; Zener-diode reference standards; analog nanovoltmeter; bandwidths; digital nanovoltmeters; low-frequency spectral analysis; noise characteristics; personal computers; standard cells; statistical functions; voltage reference standards; Bandwidth; Cables; Digital filters; Frequency; Instruments; Low-frequency noise; Microcomputers; Spectral analysis; Voltage; Voltmeters;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location :
Braunschweig, Germany
Print_ISBN :
0-7803-3376-4
DOI :
10.1109/CPEM.1996.547099
