• DocumentCode
    2452377
  • Title

    The multi-state radiometer: a novel means for impedance and noise temperature measurement

  • Author

    Wiatr, W. ; Schmidt-Szalowski, M.

  • Author_Institution
    Inst. of Electron. Fundamentals, Warsaw Univ. of Technol., Poland
  • fYear
    1996
  • fDate
    17-21 June 1996
  • Firstpage
    372
  • Lastpage
    373
  • Abstract
    A unique noise measurement system for simultaneous determination of the impedance and noise temperature of microwave one-ports is presented. It employs a multi-state total-power radiometer, and techniques of calibration and error correction. Good measurement accuracy has been achieved using a high precision radiometer fitted with a noise injecting circuit to excite the DUT.
  • Keywords
    calibration; electric impedance measurement; electric noise measurement; error correction; measurement errors; microwave measurement; radiometers; radiometry; semiconductor device testing; calibration; de-embedding device parameters; error correction; high precision radiometer; impedance measurement; measurement accuracy; microwave one-ports; multi-state radiometer; multi-state total-power radiometer; noise injecting circuit; noise temperature measurement; semiconductor device; Acoustic reflection; Bridge circuits; Circuit noise; Impedance; Instruments; Microwave radiometry; Microwave technology; Noise measurement; Semiconductor device noise; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 1996 Conference on
  • Conference_Location
    Braunschweig, Germany
  • Print_ISBN
    0-7803-3376-4
  • Type

    conf

  • DOI
    10.1109/CPEM.1996.547120
  • Filename
    547120