DocumentCode :
2452808
Title :
Experimental analysis of the dynamic performance of Si, GaAs and SiC Diodes
Author :
Blinov, A. ; Vinnikov, D. ; Rang, T.
Author_Institution :
Dept. of Electr. Drives & Power Electron., TUT, Tallinn, Estonia
fYear :
2012
fDate :
3-5 Oct. 2012
Firstpage :
49
Lastpage :
52
Abstract :
This paper presents original test results using GaAs and SiC based diode structures instead of Si based fast recovery diode structures to be applied in a new voltage fed step-up DC/DC converter. Overall test results show that the GaAs diodes behave similarly to fast recovery silicon diodes assuming equal operating and cooling conditions. As expected, SiC Schottky diode was found to show a clear advantage in terms of reverse-recovery characteristics. The positive temperature coefficient of the on-state voltage drop of GaAs and SiC diodes could provide significant application advantage in high-power applications, where the parallel connection of devices is necessary.
Keywords :
DC-DC power convertors; III-V semiconductors; Schottky diodes; electric potential; elemental semiconductors; gallium arsenide; power semiconductor diodes; silicon; silicon compounds; wide band gap semiconductors; GaAs; Si; SiC; cooling condition; dynamic performance; experimental analysis; fast recovery Schottky diode structure; high-power application; on-state voltage drop; positive temperature coefficient; reverse-recovery characteristics; voltage fed step-up DC-DC converter; Gallium arsenide; Schottky diodes; Silicon; Silicon carbide; Switches; Topology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Conference (BEC), 2012 13th Biennial Baltic
Conference_Location :
Tallinn
ISSN :
1736-3705
Print_ISBN :
978-1-4673-2775-6
Type :
conf
DOI :
10.1109/BEC.2012.6376812
Filename :
6376812
Link To Document :
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