DocumentCode
2452973
Title
Multiple fault diagnosis with BDD based boolean differential equations
Author
Ubar, Raimund ; Raik, Jaan ; Kostin, Sergei ; Kõusaar, Jaak
Author_Institution
TTU, Tallinn, Estonia
fYear
2012
fDate
3-5 Oct. 2012
Firstpage
77
Lastpage
80
Abstract
We present a new idea for multiple fault diagnosis in combinational circuits, which combines the concept of multiple fault testing by test groups and solving Boolean differential equations by manipulation of Binary Decision Diagrams (BDDs). A novel 5-valued algebra is introduced for simplifying differential equations, and a discussion is presented how this approach can be used as a basis for hierarchical fault diagnosis to cope with the complexity problem.
Keywords
Boolean algebra; binary decision diagrams; circuit testing; combinational circuits; differential equations; fault diagnosis; 5-valued algebra; BDD; Boolean differential equation; binary decision diagram manipulation; combinational circuit; complexity problem; multiple fault diagnosis; multiple fault testing; Boolean functions; Circuit faults; Data structures; Differential equations; Fault diagnosis; Integrated circuit modeling; Mathematical model;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Conference (BEC), 2012 13th Biennial Baltic
Conference_Location
Tallinn
ISSN
1736-3705
Print_ISBN
978-1-4673-2775-6
Type
conf
DOI
10.1109/BEC.2012.6376819
Filename
6376819
Link To Document