• DocumentCode
    2452973
  • Title

    Multiple fault diagnosis with BDD based boolean differential equations

  • Author

    Ubar, Raimund ; Raik, Jaan ; Kostin, Sergei ; Kõusaar, Jaak

  • Author_Institution
    TTU, Tallinn, Estonia
  • fYear
    2012
  • fDate
    3-5 Oct. 2012
  • Firstpage
    77
  • Lastpage
    80
  • Abstract
    We present a new idea for multiple fault diagnosis in combinational circuits, which combines the concept of multiple fault testing by test groups and solving Boolean differential equations by manipulation of Binary Decision Diagrams (BDDs). A novel 5-valued algebra is introduced for simplifying differential equations, and a discussion is presented how this approach can be used as a basis for hierarchical fault diagnosis to cope with the complexity problem.
  • Keywords
    Boolean algebra; binary decision diagrams; circuit testing; combinational circuits; differential equations; fault diagnosis; 5-valued algebra; BDD; Boolean differential equation; binary decision diagram manipulation; combinational circuit; complexity problem; multiple fault diagnosis; multiple fault testing; Boolean functions; Circuit faults; Data structures; Differential equations; Fault diagnosis; Integrated circuit modeling; Mathematical model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Conference (BEC), 2012 13th Biennial Baltic
  • Conference_Location
    Tallinn
  • ISSN
    1736-3705
  • Print_ISBN
    978-1-4673-2775-6
  • Type

    conf

  • DOI
    10.1109/BEC.2012.6376819
  • Filename
    6376819