DocumentCode :
2453061
Title :
Effects of Structure Parameters and Stress for Capacitive Switches MEMS Bridge on Time Response
Author :
He, Xun-jun ; Wu, Qun ; Song, Ming-Xin ; Yin, Jing-Hua
Author_Institution :
Sch. of Electron. & Inf. Technol., Harbin Inst. of Technol., Harbin
fYear :
2006
fDate :
26-29 Oct. 2006
Firstpage :
1
Lastpage :
3
Abstract :
In this paper, a novel method for analyzing the switching time of the electrostatic driven RF MEMS capacitive switches is presented. The effects of the structure parameters which mainly include the width, length and thickness and stress for capacitive switches MEMS bridge on time response are investigated using the SYNPLE module of IntelliSuitetrade tool. The result shows that the width of MEMS bridge and the stress in bridge indistinctively affect on time response, while the length and thickness of MEME bridge distinctively effect on time response.
Keywords :
electrostatic devices; microswitches; microwave switches; stress effects; IntelliSuite tool; MEMS bridge; SYNPLE module; capacitive switch; electrostatic driven RF MEMS; stress; structure parameters; time response; Bridge circuits; Communication switching; Electrodes; Electrostatics; Micromechanical devices; Radiofrequency microelectromechanical systems; Solid modeling; Stress; Switches; Time factors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas, Propagation & EM Theory, 2006. ISAPE '06. 7th International Symposium on
Conference_Location :
Guilin
Print_ISBN :
1-4244-0162-3
Electronic_ISBN :
1-4244-0163-1
Type :
conf
DOI :
10.1109/ISAPE.2006.353319
Filename :
4168360
Link To Document :
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