Title :
ArISE: Aging-aware instruction set encoding for lifetime improvement
Author :
Oboril, Fabian ; Tahoori, Mehdi
Author_Institution :
Dept. of Dependable Nano-Comput., Karlsruhe Inst. of Technol. (KIT), Karlsruhe, Germany
Abstract :
Microprocessors fabricated at nanoscale nodes are exposed to accelerated transistor aging due to Bias Temperature Instability and Hot Carrier Injection. As a result, device delays increase over time reducing the Mean Time To Failure (MTTF) of the processor. To address this challenge, many (micro)-architectural techniques target the execution stage of the instruction pipeline, as this one is typically most critical. However, also the decoding stages can become aging-critical and limit the microprocessor lifetime, as we will show in this work. In this paper, we propose a novel aging-aware instruction set encoding methodology (ArISE), that improves the instruction encoding iteratively using a heuristic algorithm. Our experimental results show that MTTF of the decoding stages can be improved by 1.93x with negligible implementation costs.
Keywords :
ageing; encoding; failure analysis; heuristic programming; hot carriers; instruction sets; integrated circuit reliability; microprocessor chips; ArISE; MTTF; accelerated transistor aging; aging-aware instruction set encoding methodology; bias temperature instability; decoding stages; device delays; heuristic algorithm; hot carrier injection; instruction pipeline; lifetime improvement; mean time to failure; microarchitectural techniques; microprocessor lifetime; nanoscale nodes; Aging; Decoding; Delays; Encoding; Logic gates; Optimization; Runtime;
Conference_Titel :
Design Automation Conference (ASP-DAC), 2014 19th Asia and South Pacific
Conference_Location :
Singapore
DOI :
10.1109/ASPDAC.2014.6742891