DocumentCode :
245319
Title :
Prediction of the BCI results For CAN bus ECU using incident wave excitation method
Author :
Wei Ting Lee ; Yung Chi Chung ; Chu Yu Chen ; Jing Jou Tang ; Chung Shun Yang
Author_Institution :
Dept. of Electr. Eng., Nat. Univ. of Tainan, Tainan, Taiwan
fYear :
2014
fDate :
26-28 May 2014
Firstpage :
175
Lastpage :
176
Abstract :
In this paper, a method called the incident wave excitation method is proposed to incorporate the effects of the coupling noise onto leads of the CAN bus. The equivalent circuit model for two wires (CAN high line and CAN low line) system is firstly derived. The distributed voltage and current sources along the lead excited by the coupling noise can be computed. The set up for the ISO bulk-current injection (BCI) measurement at the IC level is performed. The computed results will be further verified and compared with BCI specific experimental results.
Keywords :
controller area networks; equivalent circuits; BCI measurement; CAN bus; CAN high line system; CAN low line system; ECU; IC level; bulk-current injection; coupling noise; distributed current sources; distributed voltage sources; equivalent circuit model; incident wave excitation method; Couplings; Current measurement; Frequency measurement; Integrated circuit modeling; Noise; Voltage measurement; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Consumer Electronics - Taiwan (ICCE-TW), 2014 IEEE International Conference on
Conference_Location :
Taipei
Type :
conf
DOI :
10.1109/ICCE-TW.2014.6904045
Filename :
6904045
Link To Document :
بازگشت