DocumentCode :
2453340
Title :
A new converter protection scheme for doubly-fed induction generators during disturbances
Author :
Yang, Jin ; Dorrell, David G. ; Fletcher, John E.
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. of Glasgow, Glasgow, UK
fYear :
2008
fDate :
10-13 Nov. 2008
Firstpage :
2100
Lastpage :
2105
Abstract :
Fault ride-through capability is one of the basic requirements for a large-scale wind farm. There are two aspects to fault ride-through: to continue power supply without breaking any part of the system and to resume normal operation after clearance of the fault. In this paper the transients of the doubly-fed induction generator is analyzed. The safe operating area characteristics of the IGBT converter are also considered. After this, the use of a high-power resistor as a traditional crowbar, DC-link braking resistor and a series dynamic resistor are discussed. From the discussion, a new protection control scheme, with a crowbar and a series dynamic resistor, is proposed. The new scheme is shown to reduce the rotor high current, maximize the working time of DFIG control then reduce the power, speed and torque fluctuations and protect it during disturbances. The method is verified using PSCAD/EMTDC simulations.
Keywords :
insulated gate bipolar transistors; power convertors; power system faults; power system protection; wind power plants; DC link braking resistor; IGBT converter; converter protection scheme; doubly fed induction generators; fault ride; high power resistor; large scale wind farm; protection control scheme; series dynamic resistor; Induction generators; Insulated gate bipolar transistors; Large-scale systems; Power supplies; Power system protection; Power system stability; Resistors; Resumes; Transient analysis; Wind farms; DFIG; Doubly-fed induction generator; converter protection; fault ride-through; wind power generation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
Conference_Location :
Orlando, FL
ISSN :
1553-572X
Print_ISBN :
978-1-4244-1767-4
Electronic_ISBN :
1553-572X
Type :
conf
DOI :
10.1109/IECON.2008.4758281
Filename :
4758281
Link To Document :
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