• DocumentCode
    245359
  • Title

    A Novel Prediction Method for Analog Circuits Based on Gaussian White Noise Estimation

  • Author

    Jingyu Zhou ; Shulin Tian ; Bing Long ; Chenglin Yang

  • Author_Institution
    Sch. of Autom. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2014
  • fDate
    19-21 Dec. 2014
  • Firstpage
    105
  • Lastpage
    112
  • Abstract
    Research on prediction about analog circuits is rarely conducted, and the only methods are prognosis of few special features extracted from output without guarantee of integrity and rationality of prognostic information, which hence influences prognostic precision. In this paper, a novel prediction method for analog circuits is proposed. In this method, time domain output waveforms in initial state and components degradation state are extracted at first, then white noise estimation is conducted to estimate the change between waveforms according to principles of noise estimation based on Kalman filter so as to obtain more reasonable fault indicators from more complete information, thereafter, a novel degradation tendency model of analog circuits is constructed according to newly obtained fault indicators, model adaption is conducted to the new model through particle filter, and prognostic method is conducted to remaining useful performance of analog circuits. Finally, experimental verification is conducted to the above conclusion.
  • Keywords
    Gaussian noise; Kalman filters; analogue circuits; fault diagnosis; particle filtering (numerical methods); prediction theory; white noise; Gaussian white noise estimation; Kalman filter; analog circuits; particle filter; prediction method; prognostic information; Adaptation models; Analog circuits; Circuit faults; Degradation; Feature extraction; Indexes; Noise; Gaussian white noise estimation; Kalman filter; analog circuits prediction; fault indicator; particle filter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Science and Engineering (CSE), 2014 IEEE 17th International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4799-7980-6
  • Type

    conf

  • DOI
    10.1109/CSE.2014.52
  • Filename
    7023563