• DocumentCode
    2453674
  • Title

    Effective Optimistic-Checker Tandem Core Design through Architectural Pruning

  • Author

    Mesa-Martínez, Francisco J. ; Renau, Jose

  • Author_Institution
    Univ. of California Santa Cruz, Santa Cruz
  • fYear
    2007
  • fDate
    1-5 Dec. 2007
  • Firstpage
    236
  • Lastpage
    248
  • Abstract
    Design complexity is rapidly becoming a limiting factor in the design of modern, high-performance microprocessors. This paper introduces an optimization technique to improve the efficiency of complex processors. Using a new metric (^Utilization), the designer can identify infrequently-used functionality which contributes little to performance and then systematically "prune" it from the design. For cases in which architectural pruning may affect design correctness, previously proposed techniques can be applied to guarantee forward progress. To explore the benefits of architectural pruning, we study a candidate Optimistic-Checker Tandem architecture, which combines a complex Alpha EV6-like out-of-order Optimistic core, with some of the underutilized functionality pruned from its design, with a non-pruned EV5-like in-order Checker core. Our results show that by removing 3% of infrequently used functionality from the optimistic core an increase in frequency of 25% can be realized. Taking into account the replay overhead triggered by the removed functionality, the Tandem system is still able to achieve a 12% overall speedup.
  • Keywords
    circuit optimisation; hardware description languages; logic design; logic testing; microprocessor chips; HDL; architectural pruning; microprocessor design; optimistic-checker tandem core design; optimization; Cost function; Design engineering; Design optimization; Frequency; Hardware design languages; Microarchitecture; Microprocessors; Out of order; Pareto optimization; Technological innovation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microarchitecture, 2007. MICRO 2007. 40th Annual IEEE/ACM International Symposium on
  • Conference_Location
    Chicago, IL
  • ISSN
    1072-4451
  • Print_ISBN
    978-0-7695-3047-5
  • Electronic_ISBN
    1072-4451
  • Type

    conf

  • DOI
    10.1109/MICRO.2007.23
  • Filename
    4408259