2453938

An Investigation Of The Validity Of The Single Bit Error Model For Particle-induced Transients By Physical Fault Injection.

Johansson, Rolf ; Karlsson, Johan ; Liden, Peter ; Dahlgren, Peter ; Torin, Jan

Chalmers University of Technology

1994

25-26 Apr 1994

57

58

Alpha particles; Application software; CMOS logic circuits; Circuit faults; Circuit simulation; Computer errors; Laboratories; Latches; Space technology; Testing;

English

ieee

Integrating Error Models with Fault Injection, 1994., Third Int'l Workshop on

conf

10.1109/WIEM.1994.654409

654409