DocumentCode
2453971
Title
Fast broad bandwidth bioimpedance measurement - the use of square wave excitation and non-uniform sampling
Author
Pliquett, Uwe ; Barthel, Andreas ; Nacke, Thomas ; Frense, Dieter ; Diaz, Laura ; Zaikou, Yahor ; Rudolph, Andreas ; Pflieger, Christian ; Westenthanner, Maximilian ; Beckmann, Dieter
Author_Institution
Inst. fur Bioprozess- und Analysenmesstechnik, Heilbad Heiligenstadt, Germany
fYear
2012
fDate
3-5 Oct. 2012
Firstpage
279
Lastpage
282
Abstract
Square wave excitation is an excellent choice for excitation signal in broad bandwidth and fast impedance measurement. The advantages are simple scalability, easy generation and straight forward data reduction by non-uniform sampling. The often cited disadvantage of low signal energy at high frequency is only partially relevant because a high sampling rate at fast changing portions of the measured signal guarantees a sufficient signal-to-noise ratio throughout the frequency range determined by the sampling speed, the slew rate of the amplifiers used and the time duration of the excitation signal. Although briefly looking at spectra of other signals suggests their better performance, having a well-designed system from signal generation through sampling and processing up to proper data mining shows the advantages of square wave excitation, especially if speed and bandwidth is important. Here we describe a method for obtaining an estimate of a broadband spectrum over several orders of magnitude while only requiring a minimum of computing power.
Keywords
bioelectric potentials; data mining; electric impedance measurement; amplifiers; broadband spectrum; computing power; data mining; data reduction; excitation signal; fast broad bandwidth bioimpedance measurement; fast impedance measurement; nonuniform sampling; signal generation; signal-to-noise ratio; square wave excitation; Current measurement; Electrodes; Frequency measurement; Impedance; Impedance measurement; Time domain analysis; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Conference (BEC), 2012 13th Biennial Baltic
Conference_Location
Tallinn
ISSN
1736-3705
Print_ISBN
978-1-4673-2775-6
Type
conf
DOI
10.1109/BEC.2012.6376871
Filename
6376871
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