DocumentCode :
2454074
Title :
Reduction of Cracking in Tl3VS4(TVS) Single Crystals
Author :
Kun, Z.K. ; Gaida, W.E.
fYear :
1983
fDate :
Oct. 31 1983-Nov. 2 1983
Firstpage :
350
Lastpage :
352
Keywords :
Crystal microstructure; Crystalline materials; Delay; Fabrication; Glass; Optical microscopy; Scanning electron microscopy; Silicon compounds; Surface cracks; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
1983 Ultrasonics Symposium
Conference_Location :
Atlanta, GA, USA
Type :
conf
DOI :
10.1109/ULTSYM.1983.198073
Filename :
1535013
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2454074
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