DocumentCode
2454289
Title
Very-high speed control of an FPGA-based finite-element-analysis permanent magnet synchronous virtual motor drive system
Author
Dufour, Christian ; Blanchette, Handy ; Bélanger, Jean
Author_Institution
Opal-RT Technol., Montreal, QC
fYear
2008
fDate
10-13 Nov. 2008
Firstpage
2411
Lastpage
2416
Abstract
Presented in this paper are the results of tests involving high-speed closed-loop control of a virtual permanent magnet synchronous motor (PMSM) drive implemented on a field-programmable gate array (FPGA) card, connected to an external controller. Three types of motor drive models are actually implemented on the FPGA card of the RT-LAB based real-time simulator used: a Park (d-q) model along with two different implementations of finite element analysis (FEA) based models. The first FEA model, previously published, is an FPGA implementation of a FEA model with an inductance calculation routine running on an associated CPU of the real-time simulator. The second FEA model has its inductance routine coded in the FPGA. One of the main objectives of the paper will be to compare the performance of the two FEA models. By virtue of the faster, FPGA-located, inductance routine update rate of the new model, it is expected that its precision at very high speed will be greater than the previous model, which was shown to be limited to 400 Hz electric frequency.
Keywords
angular velocity control; closed loop systems; field programmable gate arrays; finite element analysis; machine control; permanent magnet motors; power engineering computing; synchronous motor drives; virtual reality; FPGA; Park model; RT-LAB; d-q model; field-programmable gate array; finite-element-analysis; high-speed closed-loop control; inductance calculation routine; permanent magnet synchronous virtual motor drive system; real-time simulator; very-high speed control; Analytical models; Field emitter arrays; Field programmable gate arrays; Finite element methods; Inductance; Magnetic analysis; Motor drives; Permanent magnet motors; Testing; Velocity control;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
Conference_Location
Orlando, FL
ISSN
1553-572X
Print_ISBN
978-1-4244-1767-4
Electronic_ISBN
1553-572X
Type
conf
DOI
10.1109/IECON.2008.4758334
Filename
4758334
Link To Document