DocumentCode
2454293
Title
Temperature dependence of the radiative recombination in GaN
Author
Bergman, J.P. ; Monemar, B. ; Amano, H. ; Akasaki, I.
Author_Institution
Dept. of Phys. & Meas. Technol., Linkoping Univ., Sweden
fYear
1996
fDate
29 Apr-3 May 1996
Firstpage
93
Lastpage
96
Abstract
We have studied the radiative recombination from two different type of GaN samples using photoluminescence and time resolved photoluminescence, in the temperature range from 2 K to room temperature. The emission at low temperatures is dominated by the recombination of donor bound excitons, with decay time of about 250 ps. At temperatures from 40 K and up to room temperature the free exciton recombination is dominating. In the bulk sample we observe an increase of the measured decay time at temperatures up to 15 K, interpreted as the presence of a dominating radiative recombination for the free exciton. The decay time of the free exciton at higher temperatures is dominated by non-radiative recombination
Keywords
III-V semiconductors; electron-hole recombination; excitons; gallium compounds; impurity states; photoluminescence; time resolved spectra; 2 to 300 K; GaN; decay time; donor bound excitons; free exciton decay time; nonradiative recombination; photoluminescence; radiative recombination; temperature dependence; time resolved photoluminescence; Excitons; Gallium nitride; Iron; Optical buffering; Photoluminescence; Photonic band gap; Radiative recombination; Substrates; Temperature dependence; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconducting and Semi-Insulating Materials Conference, 1996. IEEE
Conference_Location
Toulouse
Print_ISBN
0-7803-3179-6
Type
conf
DOI
10.1109/SIM.1996.570887
Filename
570887
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