• DocumentCode
    2454293
  • Title

    Temperature dependence of the radiative recombination in GaN

  • Author

    Bergman, J.P. ; Monemar, B. ; Amano, H. ; Akasaki, I.

  • Author_Institution
    Dept. of Phys. & Meas. Technol., Linkoping Univ., Sweden
  • fYear
    1996
  • fDate
    29 Apr-3 May 1996
  • Firstpage
    93
  • Lastpage
    96
  • Abstract
    We have studied the radiative recombination from two different type of GaN samples using photoluminescence and time resolved photoluminescence, in the temperature range from 2 K to room temperature. The emission at low temperatures is dominated by the recombination of donor bound excitons, with decay time of about 250 ps. At temperatures from 40 K and up to room temperature the free exciton recombination is dominating. In the bulk sample we observe an increase of the measured decay time at temperatures up to 15 K, interpreted as the presence of a dominating radiative recombination for the free exciton. The decay time of the free exciton at higher temperatures is dominated by non-radiative recombination
  • Keywords
    III-V semiconductors; electron-hole recombination; excitons; gallium compounds; impurity states; photoluminescence; time resolved spectra; 2 to 300 K; GaN; decay time; donor bound excitons; free exciton decay time; nonradiative recombination; photoluminescence; radiative recombination; temperature dependence; time resolved photoluminescence; Excitons; Gallium nitride; Iron; Optical buffering; Photoluminescence; Photonic band gap; Radiative recombination; Substrates; Temperature dependence; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconducting and Semi-Insulating Materials Conference, 1996. IEEE
  • Conference_Location
    Toulouse
  • Print_ISBN
    0-7803-3179-6
  • Type

    conf

  • DOI
    10.1109/SIM.1996.570887
  • Filename
    570887