Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition

fYear

2002

fDate

8-8 March 2002

Abstract

The following topics are dealt with: semiconductor IP; formal verification; cooling; power management; defect oriented test; SAT and BDD techniques; low power design; mixed signal test; collaborative design; logic synthesis; symbolic techniques; EDA tools; analogue circuits; asynchronous circuits; BIST; DFT; co-design; SoC; embedded systems; reconfigurable architectures; analogue modelling; object oriented design; interconnect modelling; fault tolerance; ATPG; high-level synthesis; and IC modelling.

Keywords

VLSI; analogue circuits; application specific integrated circuits; asynchronous circuits; automatic test pattern generation; built-in self test; cooling; design for testability; electronic design automation; embedded systems; fault tolerance; formal verification; hardware-software codesign; industrial property; integrated circuit interconnections; integrated circuit modelling; logic CAD; low-power electronics; mixed analogue-digital integrated circuits; object-oriented methods; reconfigurable architectures; ATPG; BDD; BIST; DFT; EDA tools; IC modelling; SAT; SoC; analogue circuits; analogue modelling; asynchronous circuits; co-design; collaborative design; cooling; defect oriented test; embedded systems; fault tolerance; formal verification; high-level synthesis; interconnect modelling; logic synthesis; low power design; mixed signal test; object oriented design; power management; reconfigurable architectures; semiconductor IP; symbolic techniques; Very-large-scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings

Conference_Location

Paris, France

ISSN

1530-1591

Print_ISBN

0-7695-1471-5

Type

conf

DOI

10.1109/DATE.2002.998238

Filename

998238