DocumentCode
2454420
Title
On nanoscale integration and gigascale complexity in the post .com world
Author
De Man, H.
Author_Institution
KU Leuven
fYear
2002
fDate
4-8 March 2002
Firstpage
12
Lastpage
12
Abstract
Summary form only given, as follows. While process technologists are obsessed to follow Moore´s curve down to nanoscale dimensions, design technologists are confronted with gigascale complexity. On the other hand, post-PC and post dotcom products require zero cost, zero energy yet software programmable novel system architectures to be sold in huge volumes and to be designed in exponentially decreasing time. How do we cope with these novel silicon architectures? What challenges in research does this create? How to create the necessary tools and skills and how to organize research and education in a world driven by shareholders value? Can you spare half an hour to reflect on these challenges to the design community?
Keywords
Automatic testing; Computer architecture; Costs; Design automation; Educational programs; Electronics industry; Europe; Power generation economics; Silicon; Software systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
Conference_Location
Paris, France
ISSN
1530-1591
Print_ISBN
0-7695-1471-5
Type
conf
DOI
10.1109/DATE.2002.998239
Filename
998239
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