Quantifying workload dependent reliability in embedded processors

With nearly three decades of continued CMOS scaling, the devices have now been pushed to their physical and reliability limits. Scaling to sub-20nm technology nodes changes the nature of reliability effects from abrupt functional problems to progressive degradation of the performance characteristics of devices and system components. The impact of unreliability results in time-dependent variability, directly translating into design uncertainty in manufactured chips. Further, application workloads can significantly affect the overall system reliability. In this work, we have analyzed aging effects on various design hierarchies of an embedded processor in 28nm running real-world applications. We have also quantified the dependencies of aging effects on switching-activity and power-state of workloads. Implementation results show that the processor timing degradation can vary from 2% to 11%, depending on the workload.