• DocumentCode
    2454595
  • Title

    A case study for the verification of complex timed circuits: IPCMOS

  • Author

    Pena, Marco A. ; Cortadella, Jordi ; Pastor, Enrich ; Smirnov, Alexander

  • Author_Institution
    Dept. of Comput. Archit., Tech. Univ. of Catalonia, Castelldefels, Spain
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    44
  • Lastpage
    51
  • Abstract
    The verification of a n-stage pulse-driven IPCMOS pipeline, for any n>0, is presented. The complexity of the system is 32n transistors and delay information is provided at the level of transistor The correctness of the circuit highly depends on the timed behavior of its components and the environment. To verify the system, three techniques have been combined: (1) relative-timing-based verification from absolute timing information, (2) assume-guarantee reasoning to verify untimed abstractions of timed components and (3) mathematical induction to verify pipelines of any length. Even though the circuit can interact with pulse-driven environments, the internal behavior between stages commits a handshake protocol that enables the use of untimed abstractions. The verification not only reports a positive answer about the correctness of the system, but also gives a set of sufficient relative-timing constraints that determine delay slacks under which correctness can be maintained
  • Keywords
    CMOS digital integrated circuits; asynchronous circuits; delays; formal verification; logic CAD; pipeline processing; protocols; timing; assume-guarantee reasoning; complex timed circuits; delay information; delay slacks; handshake protocol; internal behavior; mathematical induction; pulse-driven IPCMOS pipeline; relative-timing-based verification; untimed abstractions; verification; Automata; Clocks; Computer aided software engineering; Computer architecture; Delay; Encoding; Explosions; Pipelines; Pulse circuits; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
  • Conference_Location
    Paris
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-1471-5
  • Type

    conf

  • DOI
    10.1109/DATE.2002.998248
  • Filename
    998248