Efficient analysis of microwave and millimeterwave circuits by the method of lines

Algorithms based on the method of lines for the analysis of multilayered planar anisotropic and gyrotropic structures are described. The layers may have different heights and widths and their permeabilities and permittivities can vary in lateral direction. The variation in vertical direction can be modelled by a sufficient number of layers with different material parameters. With the proposed impedance/admittance transformation algorithms through the layers and from one side of the arbitrary metallization to the other a numerically stable algorithm is obtained. To improve the accuracy, crossed discretization lines schemes have been introduced. Similar schemes have also been be used for the analysis of rectangular and planar waveguide junctions. The algorithms are substantiated by numerical results