• DocumentCode
    2454802
  • Title

    Low power error resilient encoding for on-chip data buses

  • Author

    Bertozzi, Davide ; Benini, Luca ; De Micheli, Giovanni

  • Author_Institution
    Dipt. di Elettronica, Inf. e Sistemistica, Bologna Univ., Italy
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    102
  • Lastpage
    109
  • Abstract
    As technology scales toward deep submicron, on-chip interconnects are becoming more and more sensitive to noise sources such as power supply noise, crosstalk, radiation induced effects, etc. Transient delay and logic faults are likely to reduce the reliability of data transfers across data-path bus lines. This paper investigates how to deal with these errors in an energy efficient way. We could opt for error correction, which exhibits larger decoding overhead, or for the retransmission of the incorrectly received data word. Provided the timing penalty associated with this latter technique can be tolerated, we show that retransmission strategies are more effective than correction ones from an energy viewpoint, both for the larger detection capability and for the minor decoding complexity. The analysis wits performed by implementing several variants of a Hamming code in the VHDL model of a processor based on the Sparc V8 architecture, and exploiting the characteristics of AMBA bus slave response cycles to carry out retransmissions in a way fully compliant with this standard on-chip bus specification
  • Keywords
    Hamming codes; VLSI; crosstalk; delays; error correction codes; fault diagnosis; hardware description languages; integrated circuit interconnections; integrated circuit noise; low-power electronics; microprocessor chips; timing; transients; AMBA bus slave response cycles; Hamming code; Sparc V8 architecture; VHDL model; crosstalk; data transfers; datapath bus lines; decoding complexity; decoding overhead; deep submicron; error correction; incorrectly received data word; logic faults; low power error resilient encoding; noise sources; on-chip data buses; on-chip interconnects; power supply noise; radiation induced effects; retransmission; retransmission strategies; timing penalty; transient delay faults; Crosstalk; Data buses; Decoding; Delay; Encoding; Energy efficiency; Error correction; Logic; Optimized production technology; Power supplies;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
  • Conference_Location
    Paris
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-1471-5
  • Type

    conf

  • DOI
    10.1109/DATE.2002.998256
  • Filename
    998256