DocumentCode :
2455432
Title :
Discrete resistive elements versus a black body source for thermal imager testing
Author :
Rossnagel, Barton L. ; Kelly, Thomas H., Jr.
fYear :
2002
fDate :
2002
Firstpage :
127
Lastpage :
132
Abstract :
A comparison of four bar target image data in the long wave infrared range using a conventional blackbody source and a discrete resistive element source is made to assess the ability of an infrared scene projector to test thermal imagers such as forward looking infrared (FLIR) systems. The test equipment used to accomplish the comparison is comprised of four basic elements. These include a QWIP radiometer, a blackbody source with 0.6 cycles/mrad 7:1 aspect ratio four bar target, an infrared scene projector, and video frame capture electronics and analysis software. The video from the radiometer of each source is used as a means of comparing and contrasting the relative performance of an etched target in front of a conventional extended blackbody source and a resistive array source. The infrared image from each source is captured by the radiometer, digitized, and subsequently analyzed. Characteristics from the digitized imagery such as uniformity and intensity modulation of the 4 bar pattern and background are used as objective measures to assess the relative performance between the two approaches.
Keywords :
blackbody radiation; display instrumentation; electric resistance; image sensors; infrared detectors; infrared imaging; natural scenes; optical projectors; radiometry; test equipment; FLIR systems; QWIP radiometer; background; bar target image data; blackbody source; digitized imagery; discrete resistive element source; discrete resistive elements; etched target relative performance; forward looking infrared systems; image intensity modulation; image uniformity; infrared scene projector; long wave infrared range; source infrared image capture; source radiometer video; test equipment; thermal imager testing; thermal target; video frame analysis software; video frame capture electronics; Etching; Image analysis; Infrared imaging; Intensity modulation; Layout; Photothermal effects; Radiometry; System testing; Test equipment; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON Proceedings, 2002. IEEE
ISSN :
1080-7725
Print_ISBN :
0-7803-7441-X
Type :
conf
DOI :
10.1109/AUTEST.2002.1047882
Filename :
1047882
Link To Document :
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