Title :
A new robust non-local algorithm for band-to-band tunneling simulation and its application to Tunnel-FET
Author :
Shen, C. ; Yang, L.T. ; Toh, E.-H. ; Heng, C.H. ; Samudra, G.S. ; Yeo, Y.C.
Author_Institution :
ECE Dept., Nat. Univ. of Singapore, Singapore, Singapore
Abstract :
A new non-local algorithm for accurately calculating the band-to-band tunneling current suitable for TCAD semiconductor simulators is proposed in this abstract. The proposed algorithm captures the essential physics of multi-dimensional tunneling in a 2D structure, and is designed to be robust and to achieve independence on the mesh grid. The new algorithm enables accurate modeling of T-FET and investigation of its device physics. Application on T-FET is demonstrated. The physical origin of the saturation of Id-Vd curve of T-FET is analyzed and clarified for the first time.
Keywords :
field effect transistors; technology CAD (electronics); tunnel transistors; T-FET; TCAD semiconductor simulator; band-band tunneling simulation; nonlocal algorithm; Charge carrier processes; Electrons; Electrostatics; Equations; FETs; MOSFETs; Robustness; Silicon; Tunneling; Voltage;
Conference_Titel :
VLSI Technology, Systems, and Applications, 2009. VLSI-TSA '09. International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
978-1-4244-2784-0
Electronic_ISBN :
1524-766X
DOI :
10.1109/VTSA.2009.5159316