• DocumentCode
    2455707
  • Title

    Rollout strategies for sequential fault diagnosis

  • Author

    Tu, Fang ; Pattipati, Krishna

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Connecticut Univ., Storrs, CT, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    269
  • Lastpage
    295
  • Abstract
    Test sequencing is a binary identification problem wherein one needs to develop a minimal expected cost testing procedure to determine which one of a finite number of possible failure sources, if any, is present. The problem can be solved optimally using dynamic programming or AND/OR graph search methods (AO*, CF and HS). However, for large systems, the associated computation with dynamic programming or AND/OR graph search methods is substantial, due to the rapidly increasing number of OR nodes (denoting ambiguity states) and AND nodes (denoting tests) in the search graph. In order to overcome the computational explosion, the one-step or multi-step lookahead heuristic algorithms have been developed to solve the test sequencing problem. In this paper, we propose to apply rollout strategies, which can be combined with the one-step or multi-step lookahead heuristic algorithms to obtain near-optimal solutions in a computationally efficient manner than the optimal strategies. The rollout strategies are illustrated and tested using a range of real-world systems. We show computational results, which suggest that the information-heuristic based rollout policies are significantly better than other rollout policies based on Huffman coding and entropy.
  • Keywords
    aerospace testing; automatic testing; fault diagnosis; identification; large-scale systems; probability; sequences; binary identification problem; faulty state probabilities; field maintenance; high safety requirements; information heuristic; large-scale systems; minimal expected cost testing procedure; mission criticality requirements; multi-step lookahead heuristic algorithms; one-step lookahead heuristic algorithms; rollout strategies; sequential fault diagnosis; test sequencing problem; Costs; Dynamic programming; Entropy; Explosions; Fault diagnosis; Heuristic algorithms; Huffman coding; Search methods; Sequential analysis; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON Proceedings, 2002. IEEE
  • ISSN
    1080-7725
  • Print_ISBN
    0-7803-7441-X
  • Type

    conf

  • DOI
    10.1109/AUTEST.2002.1047898
  • Filename
    1047898