DocumentCode
2455751
Title
IVI comes of age: an overview of IVI specifications with current status
Author
Bode, Fred
Author_Institution
IVI Found., San Diego, CA, USA
fYear
2002
fDate
2002
Firstpage
317
Lastpage
323
Abstract
IVI stands for Interchangeable Virtual Instruments. The IVI Foundation was formed in 1997 and is a consortium founded to promote standard specifications for programmable test instruments The IVI Foundation focuses on the needs of users who build high performance test systems. By building on existing industry standards such as VXIplug&play driver concepts, the Foundation´s goal is to deliver specifications that simplify interchangeability, provide better performance and maintainable test programs. To date, only a few IVI drivers have been available. In the past year, the IVI Foundation finished a major revision of it´s architecture, and has released a blizzard of specifications, increasing its IVI Class specification by 80%, and dramatically improving the consistency and quality of released drivers. The DOD has expressed major interest in IVI´s success. With the recent successful completion of the current set of specifications, the DOD has expressed interest in becoming involved in defining the next set of Class Specifications. The NxTest Working Group lists IVI as a key technical element, and the DOD has recently requested that the IVI Foundation consider Electro Optical equipment for their next set of Class Specifications. A Working Group has been formed to more clearly define this activity.
Keywords
automatic test equipment; standards; virtual instrumentation; IVI Foundation; IVI drivers; high performance test systems; interchangeability; interchangeable virtual instruments; maintainable test programs; programmable test instruments; standard specifications; Aerospace electronics; Automatic testing; Costs; Electronic equipment testing; Instruments; Military aircraft; Software testing; System testing; Test equipment; US Department of Defense;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON Proceedings, 2002. IEEE
ISSN
1080-7725
Print_ISBN
0-7803-7441-X
Type
conf
DOI
10.1109/AUTEST.2002.1047901
Filename
1047901
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