Title :
A Novel Relative Frequency Based Ring Oscillator Physical Unclonable Function
Author :
Chaohui Du ; Guoqiang Bai
Author_Institution :
Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
Abstract :
Silicon physical unclonable function (PUF) exploits the random variation in the manufacturing process to extract unique information for each chip. Ring oscillator PUF (RO-PUF) is easy to implement for both ASIC and FPGA, and it becomes one of the most popular techniques to build a PUF. However, the unwanted systematic process variation degrades the randomness and uniqueness of RO-PUF. To reduce the effect of the systematic process variation and improve the randomness and uniqueness of RO-PUF, we propose a novel relative frequency based RO-PUF which exploits the differences between relative frequencies instead of absolute frequencies to generate unique secrets. Our proposed RO-PUF is lightweight, and it does not need extra hardware resources compared with the conventional RO-PUF. Experimental results on 193 FPGAs showed that the proposed RO-PUF could improve the average fractional hamming weight of a n-bit response from 25.34% to 50.40% and the average inter-die fractional hamming distance from 31.40% to 46.83%. Moreover, we propose a post-processing scheme to improve the reliability of the enrolled challenge response pairs, and it could reduce the error rate of the relative frequency based RO-PUF from 17.05% to 5.73% in the worst case.
Keywords :
field programmable gate arrays; oscillators; reliability; ASIC; FPGA; average fractional hamming weight; average interdie fractional hamming distance; post-processing scheme; random variation; relative frequency based RO-PUF; ring oscillator PUF; silicon physical unclonable function; systematic process variation; Field programmable gate arrays; Hardware; Integrated circuit reliability; Random processes; Ring oscillators; Systematics; Manufacturing process variation; Physical unclonable function; Randomness; Relative frequency; Reliability; Ring oscillator; Systematic process variation; Uniqueness;
Conference_Titel :
Computational Science and Engineering (CSE), 2014 IEEE 17th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4799-7980-6
DOI :
10.1109/CSE.2014.129