Title :
SPADs for quantum random number generators and beyond
Author :
Burri, Samuel ; Stucki, Damien ; Maruyama, Y. ; Bruschini, Claudio ; Charbon, E. ; Regazzoni, Francesco
Author_Institution :
Sch. of Comput. & Commun. Sci., EPFL, Lausanne, Switzerland
Abstract :
Single-Photon Avalanche Diodes (SPADs) are solid-state photo-detectors capable of detecting single photons by exploiting the avalanche effect that occurs in the breakdown of a p-n junction biased above breakdown voltage. By this effect, a SPAD translates an incoming photon to a macroscopic current pulse. These devices are currently used for building medical devices characterized by a very high time resolution. An appealing application of SPAD is to use them as a basic block for building the entropy source of true random number generators. In this paper we focus on such application, and we explore the design challenges behind the realization of a quantum random number generator based on a massively parallel array of SPADs. The matrix under investigation comprises 512×128 independent cells that convert photons onto a raw bit-stream, which, as ensured by the properties of quantum physics, is characterized by a very high level of randomness. The sequences are read out in a 128-bit parallel bus, concatenated, and pipelined onto a de-biasing filter. Subsequently, we fabricated the proposed chip using a standard CMOS process. Our results, achieved on the manufactured device and coupling two matrices, show that our architecture can reach up to 5 Gbit/s while consuming 25pJ/bit, thus demonstrating scalability and performance for any random number generators based on SPADs.
Keywords :
CMOS integrated circuits; avalanche photodiodes; electric breakdown; photodetectors; random number generation; 128-bit parallel bus; SPAD; avalanche effect; breakdown voltage; debiasing filter; entropy source; macroscopic current pulse; massively parallel array; p-n junction breakdown; quantum physics; quantum random number generator; raw bitstream; single-photon avalanche diodes; solid-state photodetectors; standard CMOS process; storage capacity 128 bit; true random number generators; Arrays; CMOS integrated circuits; Generators; Light emitting diodes; Photonics; Standards; Throughput;
Conference_Titel :
Design Automation Conference (ASP-DAC), 2014 19th Asia and South Pacific
Conference_Location :
Singapore
DOI :
10.1109/ASPDAC.2014.6742986