• DocumentCode
    2455985
  • Title

    A quaternion-based tilt angle correction method for a hand-held device using an inertial measurement unit

  • Author

    Won, Seong-hoon ; Parnian, Neda ; Golnaraghi, Farid ; Melek, William

  • Author_Institution
    Univ. of Waterloo, Waterloo, ON
  • fYear
    2008
  • fDate
    10-13 Nov. 2008
  • Firstpage
    2971
  • Lastpage
    2975
  • Abstract
    A gyro-based orientation sensor is prone to orient drift due to an integration step. However, a triaxial accelerometer does not require any integration step to calculate the tilt angles, and the calculated tilt angles do not drift over time. In order to find the tilt angles from a triaxial accelerometer, the sensor should be in an acceleration-free condition. In this paper, an expert system is proposed to identify the stationary state of an inertial measurement unit (IMU). A Kalman filter is designed to reduce the noises of the sensors to make the expert system more reliable. To validate the tilt angle correction method, two different tests are conducted: static and dynamic. When an IMU remains stationary for 30 seconds, almost no angular error is observed: The yaw angle stayed at almost 0deg for 30 seconds, and the roll and pitch angles are derived from the accelerations measured by accelerometers. For the dynamic test, the IMU is moved and then returned to the original orientation. The roll and pitch angles are almost perfectly corrected but the yaw angle exhibits no significant improvement.
  • Keywords
    Kalman filters; accelerometers; gyroscopes; inertial navigation; Kalman filter; gyro based orientation sensor; handheld devices; inertial measurement unit; integration step; quaternion-based tilt angle correction; triaxial accelerometer; Acceleration; Accelerometers; Angular velocity; Expert systems; Goniometers; Measurement units; Quaternions; Robot sensing systems; Testing; Vehicle dynamics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-1767-4
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2008.4758433
  • Filename
    4758433