• DocumentCode
    245610
  • Title

    PROCEED: A pareto optimization-based circuit-level evaluator for emerging devices

  • Author

    Shaodi Wang ; Pan, Andrew ; Chi On Chui ; Gupta, Puneet

  • Author_Institution
    Dept. of Electr. Eng., Univ. of California, Los Angeles, Los Angeles, CA, USA
  • fYear
    2014
  • fDate
    20-23 Jan. 2014
  • Firstpage
    818
  • Lastpage
    824
  • Abstract
    Evaluation of novel devices in a circuit context is crucial to identifying and maximizing their value. We propose a new framework, PROCEED, and metrics for accurate device-circuit co-evaluation through proper optimization of digital circuit benchmarks. PROCEED assesses technology suitability over a wide operating region (MHz to GHz) by leveraging available circuit knobs (Vt assignment, power management, sizing, etc.) and improves accuracy by 3X to 115X compared to existing methods while offering orders of magnitude improvements in runtime over full physical design implementation flows. To illustrate PROCEED´s capabilities, we deploy it to assess novel tunneling transistors (TFETs) compared to conventional CMOS.
  • Keywords
    Pareto optimisation; circuit simulation; field effect transistors; tunnel transistors; PROCEED; Pareto optimization-based circuit-level evaluator for emerging devices; TFET; circuit knobs; conventional CMOS; device-circuit co-evaluation accuracy; digital circuit benchmark optimization; full-physical design implementation flows; tunneling transistors; Delays; Integrated circuit interconnections; Integrated circuit modeling; Load modeling; Logic gates; Optimization; Silicon; Pareto optimization; Tunneling transistor (TFET); circuit-level device evaluation; silicon-on-insulator (SOI); simulation-based optimization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (ASP-DAC), 2014 19th Asia and South Pacific
  • Conference_Location
    Singapore
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2014.6742991
  • Filename
    6742991