DocumentCode
245610
Title
PROCEED: A pareto optimization-based circuit-level evaluator for emerging devices
Author
Shaodi Wang ; Pan, Andrew ; Chi On Chui ; Gupta, Puneet
Author_Institution
Dept. of Electr. Eng., Univ. of California, Los Angeles, Los Angeles, CA, USA
fYear
2014
fDate
20-23 Jan. 2014
Firstpage
818
Lastpage
824
Abstract
Evaluation of novel devices in a circuit context is crucial to identifying and maximizing their value. We propose a new framework, PROCEED, and metrics for accurate device-circuit co-evaluation through proper optimization of digital circuit benchmarks. PROCEED assesses technology suitability over a wide operating region (MHz to GHz) by leveraging available circuit knobs (Vt assignment, power management, sizing, etc.) and improves accuracy by 3X to 115X compared to existing methods while offering orders of magnitude improvements in runtime over full physical design implementation flows. To illustrate PROCEED´s capabilities, we deploy it to assess novel tunneling transistors (TFETs) compared to conventional CMOS.
Keywords
Pareto optimisation; circuit simulation; field effect transistors; tunnel transistors; PROCEED; Pareto optimization-based circuit-level evaluator for emerging devices; TFET; circuit knobs; conventional CMOS; device-circuit co-evaluation accuracy; digital circuit benchmark optimization; full-physical design implementation flows; tunneling transistors; Delays; Integrated circuit interconnections; Integrated circuit modeling; Load modeling; Logic gates; Optimization; Silicon; Pareto optimization; Tunneling transistor (TFET); circuit-level device evaluation; silicon-on-insulator (SOI); simulation-based optimization;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (ASP-DAC), 2014 19th Asia and South Pacific
Conference_Location
Singapore
Type
conf
DOI
10.1109/ASPDAC.2014.6742991
Filename
6742991
Link To Document