• DocumentCode
    2456349
  • Title

    Congestion-aware logic synthesis

  • Author

    Pandini, Davide ; Pileggi, Lawrence T. ; Strojwas, Andrzej J.

  • Author_Institution
    Central R&D, STMicroelectronics, Agrate Brianza, Italy
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    664
  • Lastpage
    671
  • Abstract
    In this era of Deep Sub-Micron (DSM) technologies, the impact of interconnects is becoming increasingly important as it relates to integrated circuit (IC) functionality and performance. In the traditional top-down IC design flow, interconnect effects are first taken into account during logic synthesis by way of wireload models. However, for technologies of 0.25 μm and below, the wiring capacitance dominates the gate capacitance and the delay estimation based on fanout and design legacy statistics can be highly inaccurate. In addition, logic block size is no longer dictated solely by total cell area, and is often limited by wiring area resources. For these reasons, wiring congestion is an extremely important design factor, and should be taken into consideration at the earliest possible stages of the design flow. In this paper we propose a novel methodology to incorporate congestion minimization within logic synthesis, and present results for industrial circuits that validate our approach
  • Keywords
    VLSI; circuit CAD; delay estimation; integrated circuit design; logic partitioning; minimisation; 0.25 μm; 0.25 micron; IC functionality; VLSI; capacitance; congestion minimization; delay estimation; industrial circuits; interconnects; logic synthesis; top-down IC design; wireload models; wiring congestion; Capacitance; Delay estimation; Integrated circuit interconnections; Integrated circuit modeling; Integrated circuit synthesis; Integrated circuit technology; Logic design; Minimization; Statistics; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
  • Conference_Location
    Paris
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-1471-5
  • Type

    conf

  • DOI
    10.1109/DATE.2002.998370
  • Filename
    998370