Title :
Incremental diagnosis and correction of multiple faults and errors
Author :
Veneris, Andreas ; Liu, J. Brandon ; Amiri, Mandana ; Abadir, Magdy S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
Abstract :
An incremental simulation-based approach to fault diagnosis and logic debugging is presented. During each iteration of the algorithm, a single suspicious location is identified and fault modeled such that the functionality of the new design becomes "closer" to its specification. The method is based on a simple and, at a first glance, counter-intuitive theoretical result along with a number of heuristics which help avoid the exponential complexity inherent to the problems. Experiments on multiple design errors and multiple stuck-at faults confirm its effectiveness and accuracy, which scales well with increasing number of errors
Keywords :
circuit simulation; combinational circuits; error correction; fault diagnosis; logic simulation; sequential circuits; exponential complexity; functionality; heuristics; incremental diagnosis; incremental simulation-based approach; logic debugging; multiple design errors; multiple errors; multiple faults; stuck-at-faults; suspicious location; Algorithm design and analysis; Chip scale packaging; Circuit faults; Context modeling; Debugging; Error correction; Failure analysis; Fault diagnosis; Logic; Transistors;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-7695-1471-5
DOI :
10.1109/DATE.2002.998378