DocumentCode :
2456605
Title :
Operating characteristics of MCTs in resonant DC link inverters
Author :
Balda, Juan C. ; Olejniczak, Kraig J. ; Redivo, Martin I. ; Sundaram, Ashok
Author_Institution :
Dept. of Electr. Eng., Arkansas Univ., Fayetteville, AR, USA
fYear :
1994
fDate :
2-6 Oct 1994
Firstpage :
1192
Abstract :
Improved performance of inverters may be obtained by increasing the switching frequency of the power semiconductor devices. Switching frequencies greater than the hard-switched limits may be obtained by using soft-switching techniques, The MOS-controlled thyristor (MCT) is a relatively new device showing a great potential in soft-switching applications involving high-power densities. Hence, the main objective of this paper is to extend the research work done on both soft-switched (resonant) inverters and MCTs by evaluating the operating characteristics of MCTs for switching frequencies up to approximately 75 kHz under a zero-voltage switching condition. A PCB is developed to subject the MCTs and passive components to stresses similar to those actually occurring in the resonant and actively-clamped resonant DC link inverter topologies. In addition, operation results of the operation of the MCT-based active clamp in the actively-clamp resonant DC link inverter and some practical implementation considerations are included
Keywords :
MOS-controlled thyristors; invertors; power semiconductor switches; printed circuit testing; resonant power convertors; semiconductor device testing; switching circuits; 75 kHz; MOS-controlled thyristor; PCB; applications; operating characteristics; passive components; performance; power density; power semiconductor devices; resonant DC link inverters; soft-switching; stresses; switching frequency; testing; zero-voltage switching; Clamps; MOSFETs; Power semiconductor devices; Resonance; Resonant inverters; Stress; Switching frequency; Thyristors; Topology; Zero voltage switching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Society Annual Meeting, 1994., Conference Record of the 1994 IEEE
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-1993-1
Type :
conf
DOI :
10.1109/IAS.1994.377580
Filename :
377580
Link To Document :
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