• DocumentCode
    2456611
  • Title

    Missile test confidence via test systems certification and associated data analysis

  • Author

    Maupin, David L.

  • fYear
    2002
  • fDate
    2002
  • Firstpage
    687
  • Lastpage
    702
  • Abstract
    This paper discusses missile data analysis from production and fleet return test runs. This data can be used to detect a wide array of potential problems. The author looks at how this data can be used by the manufacturers and depots that collect it. I will also examine data analysis visual display chart types and how to effectively group the results. Future trends in the use of the analysis programs will also be briefly explored.
  • Keywords
    aerospace testing; certification; data analysis; missiles; data analysis; depots; fleet return test runs; missile test; test confidence; test systems certification; visual display chart types; Certification; Corona; Data analysis; Hardware; Manufacturing; Missiles; Production systems; System testing; Test equipment; Weapons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON Proceedings, 2002. IEEE
  • ISSN
    1080-7725
  • Print_ISBN
    0-7803-7441-X
  • Type

    conf

  • DOI
    10.1109/AUTEST.2002.1047950
  • Filename
    1047950