DocumentCode
2456611
Title
Missile test confidence via test systems certification and associated data analysis
Author
Maupin, David L.
fYear
2002
fDate
2002
Firstpage
687
Lastpage
702
Abstract
This paper discusses missile data analysis from production and fleet return test runs. This data can be used to detect a wide array of potential problems. The author looks at how this data can be used by the manufacturers and depots that collect it. I will also examine data analysis visual display chart types and how to effectively group the results. Future trends in the use of the analysis programs will also be briefly explored.
Keywords
aerospace testing; certification; data analysis; missiles; data analysis; depots; fleet return test runs; missile test; test confidence; test systems certification; visual display chart types; Certification; Corona; Data analysis; Hardware; Manufacturing; Missiles; Production systems; System testing; Test equipment; Weapons;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON Proceedings, 2002. IEEE
ISSN
1080-7725
Print_ISBN
0-7803-7441-X
Type
conf
DOI
10.1109/AUTEST.2002.1047950
Filename
1047950
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