Title :
Missile test confidence via test systems certification and associated data analysis
Author :
Maupin, David L.
Abstract :
This paper discusses missile data analysis from production and fleet return test runs. This data can be used to detect a wide array of potential problems. The author looks at how this data can be used by the manufacturers and depots that collect it. I will also examine data analysis visual display chart types and how to effectively group the results. Future trends in the use of the analysis programs will also be briefly explored.
Keywords :
aerospace testing; certification; data analysis; missiles; data analysis; depots; fleet return test runs; missile test; test confidence; test systems certification; visual display chart types; Certification; Corona; Data analysis; Hardware; Manufacturing; Missiles; Production systems; System testing; Test equipment; Weapons;
Conference_Titel :
AUTOTESTCON Proceedings, 2002. IEEE
Print_ISBN :
0-7803-7441-X
DOI :
10.1109/AUTEST.2002.1047950
