DocumentCode
245677
Title
Rényi´s Entropy Based Method for Analog Circuits Soft Fault Detection
Author
Xuan Xie ; Xifeng Li ; Dongjie Bi ; Qizhong Zhou ; Yongle Xie ; Sanshan Xie
Author_Institution
Sch. of Autom. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
fYear
2014
fDate
19-21 Dec. 2014
Firstpage
825
Lastpage
830
Abstract
We propose a Rényi´s entropy based analog circuit soft fault detection method. This method extracts the entropy information from the probability density function (PDF) of the output of the circuit under test (CUT), which is sensitive to the parameters of circuits. In this method, firstly, the Lagrange multiplier method with Rényi´s entropy is used to deduce PDF of the output signal. Then through the maximum likelihood estimation method, we estimate the parameter α of Rényi´s entropy adaptively according to the output of CUT. Finally, the value of Rényi´s entropy can be calculated using the PDF and α parameter. The divergence between the Rényi´s entropy corresponding to the fault and fault free circuits is adopted to detect the fault. This method can 100% detect soft faults, including the single fault and multiple faults, without complicate models and mass of data, and also with no need of interrupting the inherent contentions of CUT. Experiments are conducted respectively on two circuits that are implemented on an actual circuit board. The effectiveness of the proposed method is demonstrated by the result of the experiment.
Keywords
analogue circuits; entropy; fault diagnosis; maximum likelihood estimation; probability; radiation hardening (electronics); CUT; Lagrange multiplier method; PDF; Rényi´s entropy based analog circuit soft fault detection method; circuit under test; entropy information; maximum likelihood estimation method; multiple faults; probability density function; single fault; Analog circuits; Band-pass filters; Circuit faults; Entropy; Estimation; Fault detection; Fault diagnosis; Lagrange multiplier method; Rényi´s entropy; analog circuit; component tolerance; soft fault;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Science and Engineering (CSE), 2014 IEEE 17th International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4799-7980-6
Type
conf
DOI
10.1109/CSE.2014.168
Filename
7023678
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