Defect Detection of Skewed Images for Multilayer Ceramic Capacitors

Author

Tseng, Chun-Chieh ; Wu, Jia-Hao ; Liao, Bin-Yih

Author_Institution

Dept. of Electron. Eng., Nat. Kaohsiung Univ. of Appl. Sci., Kaohsiung, Taiwan

fYear

2009

fDate

12-14 Sept. 2009

Firstpage

840

Lastpage

843

Abstract

In this paper, we utilized machine vision and image processing to develop an image detection flow for the dimension and appearance of multilayer ceramic capacitors (MLCC), and also used proposed automatic optical inspection (AOI) system in the MLCC production line operation. We compared the advantages and disadvantages of Hough Transform and Histogram analysis. The proposed tiny passive components detection flow can execute the defect detection of each capacitor in real time as soon as the image information of the component is obtained. If defect can be found on the detection flow, it can be immediately judged and classified into defective components, and detection time of each component can be significantly reduced.

Keywords

automatic optical inspection; ceramic capacitors; computer vision; AOI; Hough transform; automatic optical inspection system; histogram analysis; image processing; machine vision; multilayer ceramic capacitors production line operation; passive components detection flow; skewed image defect detection; Capacitors; Ceramics; Charge-coupled image sensors; Electrodes; Image processing; Inspection; Lenses; Lighting control; Motion control; Nonhomogeneous media;

fLanguage

English

Publisher

ieee

Conference_Titel

Intelligent Information Hiding and Multimedia Signal Processing, 2009. IIH-MSP '09. Fifth International Conference on

Conference_Location

Kyoto

Print_ISBN

978-1-4244-4717-6

Electronic_ISBN

978-0-7695-3762-7

Type

conf

DOI

10.1109/IIH-MSP.2009.315

Filename

5337101