Title :
New voltage sensing terminal of the IGBT for the short-circuit protection with suppressed floating effect by employing the internal PMOS
Author :
Ji, In-Hwan ; Choi, Young-Hwan ; Cho, Kyu-Heon ; Kim, Young-Shil ; Han, Min Koo
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul
Abstract :
We have proposed a new floating p-well voltage reset scheme for reliable and fast discharging voltage sensing terminal by employing the negative gate bias, which stabilizes the floating p-well voltage spontaneously during the transient state and off-state by turning on the internal PMOS of the floating p-well IGBT. We have investigated the switching stability characteristics of the floating p-well voltage. Experimental results show that the discharging time and voltage spike of the floating p-well voltage is successfully controlled by employing the gate bias polarity and filter capacitor. Simulation results also shows that the hole current diverting effect due to the turn-on of the internal PMOS suppresses the floating p-well voltage during the turn-off transient.
Keywords :
insulated gate bipolar transistors; power MOSFET; power bipolar transistors; IGBT; discharging voltage sensing terminal; filter capacitor; floating p-well voltage; floating p-well voltage reset scheme; gate bias polarity; internal PMOS; negative gate bias; short-circuit protection; suppressed floating effect; switching stability characteristics; turn-off transient; Circuit faults; Electrical fault detection; Fault detection; Filters; Insulated gate bipolar transistors; Protection; Stability; Thermal stresses; Turning; Voltage control;
Conference_Titel :
Power Electronics Specialists Conference, 2008. PESC 2008. IEEE
Conference_Location :
Rhodes
Print_ISBN :
978-1-4244-1667-7
Electronic_ISBN :
0275-9306
DOI :
10.1109/PESC.2008.4591985