• DocumentCode
    2456871
  • Title

    Fuses for power IGBT-converters

  • Author

    Duong, Son V. ; Schaeffer, Christian ; Rouve, Laure-Line ; De Palma, Jean-Francois ; Mullert, Charles

  • Author_Institution
    Lab. d´´Electrotech. de Grenoble, CNRS, St. Martin d´´Heres, France
  • fYear
    1994
  • fDate
    2-6 Oct 1994
  • Firstpage
    1336
  • Abstract
    The case of a power IGBT can be severely damaged by high fault currents. Fast fuses can eliminate this problem. Studies and tests show that a specially designed fuse can prevent an IGBT from exploding and keep the circuit inductance below acceptable values. A thermal model is proposed in order to see how an IGBT behaves thermally during short circuits and thus to select the appropriate fuse´s rating
  • Keywords
    current limiters; electric fuses; insulated gate bipolar transistors; overcurrent protection; power bipolar transistors; power convertors; semiconductor device models; semiconductor device testing; short-circuit currents; thermal analysis; circuit inductance; fast fuses; fault currents; power IGBT; power convertor; rating selection; short circuits; thermal model; Choppers; Circuit testing; Explosions; Fault currents; Fuses; Inductance; Insulated gate bipolar transistors; Protection; Thermal stresses; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Society Annual Meeting, 1994., Conference Record of the 1994 IEEE
  • Conference_Location
    Denver, CO
  • Print_ISBN
    0-7803-1993-1
  • Type

    conf

  • DOI
    10.1109/IAS.1994.377594
  • Filename
    377594