Title :
Fuses for power IGBT-converters
Author :
Duong, Son V. ; Schaeffer, Christian ; Rouve, Laure-Line ; De Palma, Jean-Francois ; Mullert, Charles
Author_Institution :
Lab. d´´Electrotech. de Grenoble, CNRS, St. Martin d´´Heres, France
Abstract :
The case of a power IGBT can be severely damaged by high fault currents. Fast fuses can eliminate this problem. Studies and tests show that a specially designed fuse can prevent an IGBT from exploding and keep the circuit inductance below acceptable values. A thermal model is proposed in order to see how an IGBT behaves thermally during short circuits and thus to select the appropriate fuse´s rating
Keywords :
current limiters; electric fuses; insulated gate bipolar transistors; overcurrent protection; power bipolar transistors; power convertors; semiconductor device models; semiconductor device testing; short-circuit currents; thermal analysis; circuit inductance; fast fuses; fault currents; power IGBT; power convertor; rating selection; short circuits; thermal model; Choppers; Circuit testing; Explosions; Fault currents; Fuses; Inductance; Insulated gate bipolar transistors; Protection; Thermal stresses; Voltage control;
Conference_Titel :
Industry Applications Society Annual Meeting, 1994., Conference Record of the 1994 IEEE
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-1993-1
DOI :
10.1109/IAS.1994.377594
