Title :
Measurement of the time dependence of the switching feeld of thin film media down to 1.6 nanoseconds
Author :
Mallary, M. ; Beauregard, R.
Author_Institution :
Quantum Corporation
Keywords :
Coercive force; Disk drives; Magnetic field measurement; Magnetic flux; Magnetic heads; Resistors; Switches; Temperature; Time measurement; Transistors;
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
DOI :
10.1109/INTMAG.2000.871791
