Title :
An optimal algorithm for the automatic generation of March tests
Author :
Benso, A. ; Di Carlo, S. ; Di Natale, G. ; Prinetto, P.
Author_Institution :
Dipt. di Automatica e Informatica, Politecnico di Torino, Italy
Abstract :
Among the different types of algorithms proposed to test random access memories (RAM), March tests have proven to be faster, simpler, regularly structured and linear in complexity. A March test consists of a sequence of March elements, each composed of a sequence of basic read/write operations to be performed on each cell of the memory, in either ascending or descending order, before proceeding to the next memory cell. The complexity of a March test is given by the number of memory operations in all March elements performed on each memory cell. This paper presents an innovative algorithm for the automatic generation of March tests. The proposed approach is able to generate an optimal March test for an unconstrained set of memory faults in very low computation time.
Keywords :
automatic test pattern generation; fault diagnosis; integrated memory circuits; logic testing; optimisation; random-access storage; March element sequence; March test automatic generation; March test complexity; RAM; ascending memory cell order; descending memory cell order; memory cell basic read/write operations; optimal test sequence algorithm; unconstrained memory fault set; Algorithm design and analysis; Automatic test pattern generation; Automatic testing; Joining processes; Performance evaluation; Postal services; Random access memory; Read-write memory; Test pattern generators; Upper bound;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
Print_ISBN :
0-7695-1471-5
DOI :
10.1109/DATE.2002.998412
