• DocumentCode
    2457193
  • Title

    How can we improve the outreach and impact of control science and engineering?

  • Author

    Annaswamy, Anuradha ; Baheti, Kishan ; Buss, Martin ; Konstantellos, Alkis ; Stewart, Greg

  • Author_Institution
    Massachusetts Institute of Technology, USA
  • fYear
    2009
  • fDate
    10-12 June 2009
  • Firstpage
    28
  • Lastpage
    28
  • Abstract
    The field of control has a long and distinguished history of achievements on intellectual and practical fronts. Prospects for the future of control are bright too, provided we can direct our skills and energies appropriately. Some traditionally strong application areas have become commoditized, but others provide new terrain where our expertise can help make a mark. Gaining recognition outside our core community has also been a constant challenge for control scientists and engineers. Whether it is because control is a “hidden technology” or because we are not good enough at marketing ourselves and our field (or, more likely, both), many of our contributions go unheralded. This session, co-sponsored by the IEEE CSS Task Force on Outreach, will discuss issues related to the outreach and impact of control. Past successes, the current state, and future prospects will be covered. Panelists will be asked to give brief remarks at the beginning of the session and we will engage the audience in an open discussion for the remaining time. This session will help provide input and direction to other activities (e.g., workshops) that are being planned to drive the “outreach and impact of controls” agenda forward. We anticipate a stimulating and provocative session and we invite all ACC attendees to observe and contribute. Box lunches will be provided (quantities are not unlimited, so come early!)
  • Keywords
    Automatic control; Automation; Control Systems Society; Control systems; Force control; History;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2009. ACC '09.
  • Conference_Location
    St. Louis, MO, USA
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4244-4523-3
  • Electronic_ISBN
    0743-1619
  • Type

    conf

  • DOI
    10.1109/ACC.2009.5159785
  • Filename
    5159785