• DocumentCode
    2457200
  • Title

    Batch on-line analytics for every user

  • Author

    Blevins, Terry ; Wojsznis, Willy ; Wojewodka, Bob

  • Author_Institution
    Emerson Process Management, USA
  • fYear
    2009
  • fDate
    10-12 June 2009
  • Firstpage
    28
  • Lastpage
    29
  • Abstract
    Process Analytical Technologies (PAT), in particular Principal Component Analysis (PCA) for fault detection and Projection to Latent Structures (PLS) for end of batch quality prediction, are seen as pivotal techniques for improving process operation. A number of software packages are available today for off-line analysis. The difficulty for control or production engineers is that these tools are not designed for on-line operation. Many PAT issues may be addressed by tightly integrating analytic tools with the production and control system. This special session examines basic design requirements associated with batch analytics applied for on-line operation. The presentation delivers an in-depth look at the data processing requirements, calculations and limitations for the application of on-line analytics to a batch process. It will show how to achieve proper data alignment for different batches, a key requirement for building good statistical models, and how to use the model for on-line analysis. A typical batch operation in the chemical industry and a running simulation will be used to illustrate the advantages of on-line process analytics over traditional monitoring and control techniques. Details will be presented on the approach taken to integrate analytic tools and results into a commercial control system with examples of control and production operation screens.
  • Keywords
    Analytical models; Batch production systems; Buildings; Chemical industry; Control systems; Data processing; Design engineering; Fault detection; Principal component analysis; Software packages;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2009. ACC '09.
  • Conference_Location
    St. Louis, MO, USA
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4244-4523-3
  • Electronic_ISBN
    0743-1619
  • Type

    conf

  • DOI
    10.1109/ACC.2009.5159786
  • Filename
    5159786