• DocumentCode
    245736
  • Title

    Improving Prediction Robustness of VAB-SVM for Cross-Project Defect Prediction

  • Author

    Duksan Ryu ; Okjoo Choi ; Jongmoon Baik

  • Author_Institution
    Dept. of Comput. Sci., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
  • fYear
    2014
  • fDate
    19-21 Dec. 2014
  • Firstpage
    994
  • Lastpage
    999
  • Abstract
    Software defect prediction is important for improving software quality. Defect predictors allow software test engineers to focus on defective modules. Cross-Project Defect Prediction (CPDP) uses data from other companies to build defect predictors. However, outliers may lower prediction accuracy. In this study, we propose a transfer learning based model called VAB-SVM for CPDP robust in handling outliers. Notably, this method deals with the class imbalance problem which may decrease the prediction accuracy. Our proposed method computes similarity weights of the training data based on the test data. Such weights are applied to Boosting algorithm considering the class imbalance. VAB-SVM outperformed the previous research more than 10% and showed a sufficient robustness regardless of the ratio of outliers.
  • Keywords
    software quality; support vector machines; Boosting algorithm; CPDP robust; VAB-SVM; class imbalance problem; cross-project defect prediction; defective modules; prediction robustness; software defect prediction; software quality; software test engineers; transfer learning based model; Accuracy; Classification algorithms; NASA; Software; Support vector machines; Training; Training data; Boosting; Cross-Project Defect Prediction; Outlier Detection; Transfer Learning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Science and Engineering (CSE), 2014 IEEE 17th International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4799-7980-6
  • Type

    conf

  • DOI
    10.1109/CSE.2014.198
  • Filename
    7023708