DocumentCode
245736
Title
Improving Prediction Robustness of VAB-SVM for Cross-Project Defect Prediction
Author
Duksan Ryu ; Okjoo Choi ; Jongmoon Baik
Author_Institution
Dept. of Comput. Sci., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
fYear
2014
fDate
19-21 Dec. 2014
Firstpage
994
Lastpage
999
Abstract
Software defect prediction is important for improving software quality. Defect predictors allow software test engineers to focus on defective modules. Cross-Project Defect Prediction (CPDP) uses data from other companies to build defect predictors. However, outliers may lower prediction accuracy. In this study, we propose a transfer learning based model called VAB-SVM for CPDP robust in handling outliers. Notably, this method deals with the class imbalance problem which may decrease the prediction accuracy. Our proposed method computes similarity weights of the training data based on the test data. Such weights are applied to Boosting algorithm considering the class imbalance. VAB-SVM outperformed the previous research more than 10% and showed a sufficient robustness regardless of the ratio of outliers.
Keywords
software quality; support vector machines; Boosting algorithm; CPDP robust; VAB-SVM; class imbalance problem; cross-project defect prediction; defective modules; prediction robustness; software defect prediction; software quality; software test engineers; transfer learning based model; Accuracy; Classification algorithms; NASA; Software; Support vector machines; Training; Training data; Boosting; Cross-Project Defect Prediction; Outlier Detection; Transfer Learning;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Science and Engineering (CSE), 2014 IEEE 17th International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4799-7980-6
Type
conf
DOI
10.1109/CSE.2014.198
Filename
7023708
Link To Document