• DocumentCode
    2457462
  • Title

    Accurate estimating simultaneous switching noises by using application specific device modeling

  • Author

    Ding, Li ; Mazumder, Pinaki

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    1038
  • Lastpage
    1043
  • Abstract
    In this paper, we study the simultaneous switching noise problem by using an application-specific modeling method. A simple yet accurate MOSFET model is proposed in order to derive closed-form formulas for simultaneous switching noise voltage waveforms. We first derive a simple formula assuming that the inductances are the only parasitics. Through HSPICE simulation, we show that the new formula is more accurate than previous results based on the same assumption. We then study the effect of the parasitic capacitances of ground bonding wires and pads. We show that the maximum simultaneous switching noise should be calculated using four different formulas depending on the value of the parasitic capacitances and the slope of the input signal. The proposed formulas, modeling both parasitic inductances and capacitances, are within 3% of HSPICE simulation results
  • Keywords
    MOSFET; SPICE; capacitance; inductance; integrated circuit modelling; integrated circuit noise; parameter estimation; semiconductor device models; HSPICE simulation; MOSFET model; application specific device modeling; closed-form formulas; ground bonding pads; ground bonding wires; inductance parasitics; input signal slope; maximum simultaneous switching noise; parasitic capacitances; simultaneous switching noise estimation; simultaneous switching noise voltage waveforms; Bonding; Design methodology; Equations; Inductance; MOSFET circuits; Packaging; Parasitic capacitance; Variable speed drives; Voltage; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
  • Conference_Location
    Paris
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-1471-5
  • Type

    conf

  • DOI
    10.1109/DATE.2002.998428
  • Filename
    998428