DocumentCode
2457545
Title
Power efficient embedded processor IPs through application-specific tag compression in data caches
Author
Petrov, Peter ; Orailoglu, Alex
Author_Institution
Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
fYear
2002
fDate
2002
Firstpage
1065
Lastpage
1071
Abstract
In this paper, we present a methodology for power minimization by data cache tag compression. The set of tags being accessed by the major application loops is analyzed statically during compile time and an efficient and optimal compression scheme is proposed Only a very limited number of tag bits are stored in the tag array for cache conflict identification, thus achieving a significant reduction in the number of active bitlines, sense amps, and comparator cells. The underlying hardware support for dynamically compressing the tags consists of a highly cost and power efficient programmable encoder which lies outside the cache access path, thus not affecting the processor cycle time. A detailed VLSI implementation has been performed and a number of experimental results on a set of embedded applications and numerical kernels is reported Energy dissipation decreases of up to 95% can be observed for the tag arrays, while significant energy reductions in the range of 10%-50% are observed when amortized across the overall cache subsystem
Keywords
VLSI; cache storage; comparators (circuits); data compression; low-power electronics; microprocessor chips; VLSI implementation; active bitlines; application loops; comparator cells; compile time; compression scheme; data cache tag compression; embedded applications; energy dissipation; numerical kernels; overall cache subsystem; power efficient embedded processor IPs; power minimization; processor cycle time; sense amps; tag bits; Computer science; Costs; Data engineering; Energy consumption; Energy dissipation; Microprocessors; Minimization methods; Power engineering and energy; Remotely operated vehicles; Technical Activities Guide -TAG;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
Conference_Location
Paris
ISSN
1530-1591
Print_ISBN
0-7695-1471-5
Type
conf
DOI
10.1109/DATE.2002.998434
Filename
998434
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