DocumentCode
2457582
Title
Parameter-Free Determination of Distance Thresholds for Metric Distance Constraints
Author
Song, Shaoxu ; Chen, Lei ; Cheng, Hong
Author_Institution
Key Lab. for Inf. Syst. Security, Tsinghua Univ., Beijing, China
fYear
2012
fDate
1-5 April 2012
Firstpage
846
Lastpage
857
Abstract
The importance of introducing distance constraints to data dependencies, such as differential dependencies (DDs) [28], has recently been recognized. The metric distance constraints are tolerant to small variations, which enable them apply to wide data quality checking applications, such as detecting data violations. However, the determination of distance thresholds for the metric distance constraints is non-trivial. It often relies on a truth data instance which embeds the distance constraints. To find useful distance threshold patterns from data, there are several guidelines of statistical measures to specify, e.g., support, confidence and dependent quality. Unfortunately, given a data instance, users might not have any knowledge about the data distribution, thus it is very challenging to set the right parameters. In this paper, we study the determination of distance thresholds for metric distance constraints, in a parameter-free style. Specifically, we compute an expected utility based on the statistical measures from the data. According to our analysis as well as experimental verification, distance threshold patterns with higher expected utility could offer better usage in real applications, such as violation detection. We then develop efficient algorithms to determine the distance thresholds having the maximum expected utility. Finally, our extensive experimental evaluation demonstrates the effectiveness and efficiency of the proposed methods.
Keywords
security of data; statistical analysis; data dependencies; data distribution; data violation detection; differential dependencies; distance thresholds parameter-free determination; metric distance constraints; Algorithm design and analysis; Association rules; Cleaning; Educational institutions; Lakes; Measurement; Pattern matching;
fLanguage
English
Publisher
ieee
Conference_Titel
Data Engineering (ICDE), 2012 IEEE 28th International Conference on
Conference_Location
Washington, DC
ISSN
1063-6382
Print_ISBN
978-1-4673-0042-1
Type
conf
DOI
10.1109/ICDE.2012.46
Filename
6228138
Link To Document