• DocumentCode
    2457654
  • Title

    Models of memristors for SPICE simulations

  • Author

    Kvatinsky, Shahar ; Talisveyberg, Keren ; Fliter, Dmitry ; Kolodny, Avinoam ; Weiser, Uri C. ; Friedman, Eby G.

  • Author_Institution
    Dept. of Electr. Eng., Technion - Israel Inst. of Technol., Haifa, Israel
  • fYear
    2012
  • fDate
    14-17 Nov. 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Memristors are novel devices which can be used in applications such as memory, logic, analog circuits, and neuromorphic systems. Several memristor technologies have been developed such as ReRAM (Resistive RAM), MRAM (Magnetoresistance RAM), and PCM (Phase Change Memory). To design circuits with memristors, the behavior of the memristor needs to be described by a mathematical model. While the model for memristors should be sufficiently accurate as compared to the behavior of physical devices, the model must also be computationally efficient. Several models for memristors have been proposed - the linear ion drift model, the nonlinear ion drift model, the Simmons tunnel barrier model, and the ThrEshold Adaptive Memristor (TEAM) model. In this paper, the different memristor models are described and a Verilog-A implementation for these models, including the relevant window functions, are presented. These models are suitable for EDA tools such as SPICE.
  • Keywords
    SPICE; hardware description languages; memristors; EDA tool; SPICE simulation; Simmons tunnel barrier model; Verilog-A implementation; circuit design; linear ion drift model; memristor model; nonlinear ion drift model; threshold adaptive memristor model; Adaptation models; Biological system modeling; Computational modeling; Hardware design languages; Mathematical model; Memristors; Semiconductor process modeling; SPICE; TEAM; Verilog-A; memristive systems; memristor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical & Electronics Engineers in Israel (IEEEI), 2012 IEEE 27th Convention of
  • Conference_Location
    Eilat
  • Print_ISBN
    978-1-4673-4682-5
  • Type

    conf

  • DOI
    10.1109/EEEI.2012.6377081
  • Filename
    6377081