• DocumentCode
    2457702
  • Title

    Efficient and effective redundancy removal for million-gate circuits

  • Author

    Berkelaar, Michel ; van Eijk, Koen

  • fYear
    2002
  • fDate
    2002
  • Firstpage
    1088
  • Abstract
    Summary form only given. In Magma´s BlastFusion® and BlastChip® software, very large blocks of logic (millions of gates) are handled flat. We implemented redundancy removal in a way that will allow it to run efficiently (fast, low memory usage) and robustly (no run time or memory explosion on any netlist) on industrial designs of up to several million gates. We achieve this without resorting to partitioning. We do not try to identify all redundancies in a circuit, as an exact solution to this NP-hard problem is infeasible for the large circuits we face. Instead we try to identify as many as possible in a reasonable run time. We use a carefully engineered combination of Fault Collapsing, Random Test Generation (RTG) and the D-algorithm.
  • Keywords
    combinational circuits; logic CAD; redundancy; BlastChip software; BlastFusion software; D-algorithm; NP-hard problem; combinational circuits; fault collapsing; million-gate circuits; random test generation; redundancy removal; Central Processing Unit; Circuit faults; Circuit synthesis; Circuit testing; Combinational circuits; Design automation; Logic circuits; Logic gates; Redundancy; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-1471-5
  • Type

    conf

  • DOI
    10.1109/DATE.2002.998445
  • Filename
    998445